Dr. Ting-Jui Chen, Assistant Professor in the Department of Electronic Engineering at Chung Yuan Christian University (CYCU), collaborated with Professor Jing Kong’s research group at the Massachusetts Institute of Technology (MIT). Their joint work, titled “Electrostatic-repulsion-based transfer of van der Waals materials,” was published in Nature (September 2025).
The study introduces an electrostatic-repulsion-driven transfer technique that overcomes key challenges in integrating 2D materials into 3D semiconductor processes, achieving superior cleanliness, structural integrity, and scalability. This atomic-level breakthrough provides a critical step toward stackable, energy-efficient semiconductor architectures.
Dr. Chen’s achievement marks a major milestone for CYCU, demonstrating its growing research excellence and international impact in advanced materials and nanoelectronics. His work also reflects CYCU’s commitment to fostering young scholars who bridge academic innovation with industrial relevance.
